JTAG Boundary Scan

JTAG technologies were developed in response to miniturisation and technology innovations and further extends Axioms test capabilities.

Benefits:-

  • Quickly diagnose interconnect problems 
  • Enables testing of highly complex and densely printed circuit boards
  • Significantly reduces the required number of physical test points on the board
  • Increased board component density
  • Corresponding reduction in costs associated with test fixtures
  • Shorter time-to-market
  • On-board testing and programming capabilities
  • Reduced in-circuit testing time
  • Reduces the need for X-Ray technology
  •  and higher production efficiency

The acronym "JTAG" stands for "Joint Test Action Group", which is the consortium of North American and European companies that defined the standard.  Click here to learn more about JTAG and the IEEE 1149.1 specification.

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